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Temperature effect on the electrical and optical properties of indium-selenide thin-films

Identifieur interne : 012706 ( Main/Repository ); précédent : 012705; suivant : 012707

Temperature effect on the electrical and optical properties of indium-selenide thin-films

Auteurs : RBID : Pascal:00-0186284

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Abstract

Indium-Selenide thin-films have been prepared by the thermal-evaporation technique at a pressure of 4.5×10-6 torr and a temperature of 673-873 K. For both the as-deposited and annealed films, (i) the electrical conductivity increased with increasing temperature and (ii) the variation of activation energy follows the island structure theory. The temperature co-efficient of resistance (T.C.R.) and Hall-effect measurements indicate that the sample is a n-type carrier. The optical spectra for both types of films were obtained in the wavelength range 0.3 < λ < 2.5 μm, and by comparing the magnitude of transmittance spectra, it is found that the annealed films are more transparent than the as-deposited ones in the UV and visible range. The integrated transmittance and reflectance values were obtained: the high values of Tlum and Tsol for the annealed films suggest that indium selenide may be used in selective-surface devices.

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<title xml:lang="en" level="a">Temperature effect on the electrical and optical properties of indium-selenide thin-films</title>
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<name sortKey="Sen, S S" uniqKey="Sen S">S. S. Sen</name>
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<term>Annealing</term>
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<term>Electrical conductivity</term>
<term>Experimental study</term>
<term>Indium selenides</term>
<term>Infrared spectra</term>
<term>Inorganic compounds</term>
<term>Integrated intensity</term>
<term>Reflection spectrum</term>
<term>Semiconductor materials</term>
<term>Temperature dependence</term>
<term>Thin films</term>
<term>Visible spectra</term>
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<term>Couche mince</term>
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<div type="abstract" xml:lang="en">Indium-Selenide thin-films have been prepared by the thermal-evaporation technique at a pressure of 4.5×10
<sup>-6</sup>
torr and a temperature of 673-873 K. For both the as-deposited and annealed films, (i) the electrical conductivity increased with increasing temperature and (ii) the variation of activation energy follows the island structure theory. The temperature co-efficient of resistance (T.C.R.) and Hall-effect measurements indicate that the sample is a n-type carrier. The optical spectra for both types of films were obtained in the wavelength range 0.3 < λ < 2.5 μm, and by comparing the magnitude of transmittance spectra, it is found that the annealed films are more transparent than the as-deposited ones in the UV and visible range. The integrated transmittance and reflectance values were obtained: the high values of T
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<sup>-6</sup>
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<sub>lum</sub>
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